SSD structures by technique
The first graph shows the total number of structure analyses included in SSD
for each technique (through 2002).
The second graphs breaks this down by year,
in percent of the total for each year.
(Thus, LEED produced all structures up to 1979,
but a smaller fraction thereafter.
No SSD structure was published in 1970.)
For an explanation of the acronyms, see the list below.
List of technique acronyms, in plotting sequence
(left to right or bottom to top):
LEED - low-energy electron diffraction;
SEXAFS - surface extended x-ray absorption fine structure;
PED - photoelectron diffraction;
IS - low-, medium- and high-energy ion scattering;
XSW - x-ray standing wave;
XRD - x-ray diffraction;
TOF-SARS - time-of-flight scattering and recoiling spectrometry;
NEXAFS - near-edge x-ray absorption fine structure;
RHEED - reflection high-energy electron diffraction;
HREELS - high-resolution electron energy loss spectroscopy;
LEPD - low-energy positron diffraction;
MEED - medium-energy electron diffraction;
AED - Auger electron diffraction;
SEELFS - surface extended energy loss fine structure;
TED - transmission electron diffraction;
AD - atom diffraction;
STM - scanning tunneling microscopy